Manufacturing method and controlling method of electronic...

Details Manufacturing method and controlling method of electronic... Manufacturing method and controlling method of electronic...

2007-09-21

2009-10-27

He, Amy (Department: 2831)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S522000, C438S017000

Reexamination Certificate

active

07609070

ABSTRACT:
A manufacturing method of an electronic device includes applying a direct voltage having a first polarity to a capacitor that has an insulating layer including nitrogen and silicon as a capacitor dielectric layer, testing the capacitor to which the direct voltage having the first polarity is applied and determining a nondefective capacitor and a defective capacitor, and applying a direct voltage having a second polarity to the nondefective capacitor. The second polarity is opposite to the first polarity.

REFERENCES:
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patent: 6294438 (2001-09-01), Arita et al.
patent: 2003/0061694 (2003-04-01), Kamitani
patent: 05-291575 (1993-11-01), None
patent: 2001-274210 (2001-10-01), None
patent: 2003-142588 (2003-05-01), None
Martin J. Brophy et al.; “MIM's the Word—Capacitors for Fun and Profit”; Proc. 2003 GaAs Mantech Conf., pp. 57-59.
Notification of Reason(s) for Refusal issued on Nov. 4, 2008 for corresponding Japanese Patent Application No. 2006-258933.

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