Manufacturing integrated circuits and testing on-die power...

Details Manufacturing integrated circuits and testing on-die power... Manufacturing integrated circuits and testing on-die power...

2007-05-01

2007-05-01

Tang, Minh N. (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S763010, C324S1540PB

Reexamination Certificate

active

10097136

ABSTRACT:
A method for designing and testing on-die power supply, power distribution, and noise suppression techniques for integrated circuits such as microprocessors is described. A network of time varying loads is distributed along the power supply grid to facilitate testing of new power supplies and grids and noise suppression techniques before design of the chip is completed. Several programmable current sinks are described for presenting loads according to a preferred test-waveform current. Transient, including droop detection, and static testing is easily performed using the described methods and circuitry.

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U.S. Appl. No. 11/095,950, entitled Programmable Current Load Systems and Methods, by Peter Hazucha, Gerhard Schrom, and Tanay Karnik, filed Mar. 31, 2005.
Dragone, Nicola, et al., “An Adaptive On-Chip Voltage Regulation Technique for Low-Power Applications”, Proceedings of the 2000 International Symposium on Low Power Electronics and Design, pp. 20-24 (Aug. 2000).

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