Manufacturing functional testing of computing devices using micr

Details Manufacturing functional testing of computing devices using micr Manufacturing functional testing of computing devices using micr

1997-03-05

1999-08-10

Beausoliel, Jr., Robert W.

395568, G06F 1126

Patent

active

059371544

ABSTRACT:
A manufacturing test system and method is presented for testing a computing system under test, which includes a computing device comprising internal emulation debug hardware and an emulation debug port through which the debug hardware is controlled. Manufacturing-level microprogram based functional tests are executed under the control of the internal emulation debug hardware of the computing device. A computing system probe applies the microprogram based functional test to the internal emulation debug hardware of the computing device via the emulation debug port. The manufacturing-level microprogram based functional test may be executed during at any level of computing device integration including the wafer, package, board, multi-chip module and system levels.

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