Manufacturing equipment of SiC single crystal and method for...

Single-crystal – oriented-crystal – and epitaxy growth processes; – Apparatus – For crystallization from liquid or supercritical state

Reexamination Certificate

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C117S015000, C117S201000, C117S218000

Reexamination Certificate

active

07314523

ABSTRACT:
A method for manufacturing a SiC single crystal from a SiC seed crystal is provided. The method includes the steps of: measuring a diameter of the SiC single crystal during a crystal growth of the SiC single crystal; and controlling the diameter of the SiC single crystal to be a predetermined diameter on the basis of the measured diameter. The method provides the SiC single crystal with high quality and large size.

REFERENCES:
patent: 5665159 (1997-09-01), Fuerhoff
patent: 5704985 (1998-01-01), Kordina et al.
patent: 5882402 (1999-03-01), Fuerhoff
patent: 6030661 (2000-02-01), Kordina et al.
patent: 6583810 (2003-06-01), Yamamura
patent: 6726764 (2004-04-01), Mutti et al.
patent: 2004/0194694 (2004-10-01), Sugiyama et al.
patent: A-6-298594 (1994-10-01), None
patent: A-2001-226197 (2001-08-01), None

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