Manufacturing defect analyzer with improved fault coverage

Details Manufacturing defect analyzer with improved fault coverage Manufacturing defect analyzer with improved fault coverage

1995-03-16

1996-11-26

Arana, Louis M.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

For fault location

324529, 324750, G01R 3108

Patent

active

055789307

ABSTRACT:
A manufacturing defect analyzer for printed circuit boards which can detect open circuit faults between leads of components and the printed circuit board. The manufacturing defect analyzer can operate in an inductive coupling mode or a capacitive coupling mode. The same sensors are used in each mode, allowing different leads on the same part to be tested using either technique. A method is also disclosed whereby the device is used to rapidly and accurately detect manufacturing defects.

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