Manufacturing defect analyzer

Details Manufacturing defect analyzer Manufacturing defect analyzer

1994-10-25

1996-05-28

Karlsen, Ernest F.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

324527, G01R 3102

Patent

active

055215130

ABSTRACT:
A method for detecting faults on a printed circuit board populated with semiconductor electronic components. To detect faults, signal pins on the components are taken in pairs. The an indication of the common mode resistance between those pins and ground is computed from a series of current measurements. An error is detected when the common mode resistance is outside of a predetermined range. A "learn mode" is also disclosed in which the pairs of leads used for the test are selected by taking measurements on a known good board without detailed knowledge of the semiconductor components on the board.

REFERENCES:
patent: 4779041 (1988-10-01), Williamson, Jr.
patent: 4779043 (1988-10-01), Williamson, Jr.
patent: 4894605 (1990-01-01), Ringleb et al.
patent: 5072175 (1991-12-01), Marek
patent: 5280237 (1994-01-01), Buks
Orientation Testing of ICs In Automatic Insertion Equipment, Akar et al. Jan. 1985.
Teradyne L529/L527 Assembly Inspection System, .COPYRGT.1979 no month.

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