Manufacture of a semiconductor device

Semiconductor device manufacturing: process – Making device or circuit emissive of nonelectrical signal – Compound semiconductor

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C438S046000, C257S014000, C257S094000, C257SE33028

Reexamination Certificate

active

10974226

ABSTRACT:
A method of fabricating the active region of a semiconductor light-emitting device, in which the active region comprises a plurality of barrier layers (11,13,15,17) with each pair of barrier layers being separated by a quantum well layer (12,14,16), comprises annealing each barrier layer (11,13,15,17) separately. Each barrier layer (11,13,15,17) is annealed once it has been grown, and before a layer is grown over the barrier layer. A device grown by the method of the invention has a significantly higher optical power output than a device made by a convention fabrication process having a single annealing step.

REFERENCES:
patent: 4400256 (1983-08-01), Riley
patent: 5777350 (1998-07-01), Nakamura et al.
patent: 6537513 (2003-03-01), Amano et al.
patent: 2002/0048836 (2002-04-01), Kano et al.
patent: 2003/0138976 (2003-07-01), Sugawara
patent: 2003/0143770 (2003-07-01), Takeya
patent: 0325100.6 (2003-10-01), None
patent: 2002-043618 (2002-02-01), None

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Manufacture of a semiconductor device does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Manufacture of a semiconductor device, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Manufacture of a semiconductor device will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3901369

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.