Manufacture method for ZnO based compound semiconductor...

Single-crystal – oriented-crystal – and epitaxy growth processes; – Forming from vapor or gaseous state – With decomposition of a precursor

Reexamination Certificate

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C117S002000, C117S003000, C117S089000, C117S095000

Reexamination Certificate

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07438762

ABSTRACT:
A manufacture method that can manufacture ZnO based compound semiconductor crystal of good quality. A ZnO substrate is prepared to have a principal surface made of a plurality of terraces of (0001) planes arranged stepwise along an m-axis direction, the envelop of the principal surface being inclined relative to the (0001) plane by about 2 degrees or less. ZnO based compound semiconductor crystal is grown on the principal surface.

REFERENCES:
patent: 6673478 (2004-01-01), Kato et al.
patent: 1 349 203 (2003-10-01), None
patent: 2003-282602 (2003-10-01), None
Kato H et al.: “Effects of slight misorientation of GaN templates on Molecular-beam-epitaxy growth of ZnO,” J. of Appl. Phys AIP USA vol. 92, No. 4, Aug. 15, 2002.
Ko H-J et al.: “Improvement of the quality of ZnO substratesw by annealing,” J. of Crystal Growth, Elsevier, Amsterdam, NL, vol. 269, No. 2-3, Sep. 1, 2004.
European Search Report dated Jan. 16, 2007 in the counterpart EP application.
Communication from the EPO in the counterpart EP application.

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