Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Reexamination Certificate
2007-04-24
2007-04-24
Hollington, Jermele (Department: 2829)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
C324S754090, C324S757020, C324S765010
Reexamination Certificate
active
10905709
ABSTRACT:
A probe support carriage for use during probing an electrical device includes a body, means for supporting and positioning the body, a plurality of flux sensors and a position sensor. The body has a first end and a second end. The plurality of flux sensors are operatively connected to the body. Each flux sensor includes a probe having a core and a coil. The core includes a material having high initial permeability and high resistivity characteristics. The probe is adapted to being supported so that a sensing portion of the core is maintained in a contact-free spaced relationship between a predetermined surface of the electrical device and the sensing portion of the core. The position sensor is adapted to determine position along a longitudinal axis of the electrical device.
REFERENCES:
patent: 3475682 (1969-10-01), Bateman et al.
patent: 3525041 (1970-08-01), Velsink
patent: 4803563 (1989-02-01), Dailey et al.
patent: 4970890 (1990-11-01), Jaafar et al.
patent: 4996486 (1991-02-01), Posedel
patent: 5252927 (1993-10-01), Bruhlmeier et al.
patent: 5295388 (1994-03-01), Fischer et al.
patent: 5341095 (1994-08-01), Shelton et al.
patent: 5446379 (1995-08-01), Machi
patent: 5446382 (1995-08-01), Flora
patent: 5473247 (1995-12-01), You et al.
patent: 5491409 (1996-02-01), Flora et al.
patent: 5557216 (1996-09-01), Dailey et al.
patent: 5701073 (1997-12-01), Baker
patent: 5990688 (1999-11-01), Bourgeois et al.
patent: 5992241 (1999-11-01), Posgay et al.
patent: 6469504 (2002-10-01), Kliman et al.
patent: 6489781 (2002-12-01), Kliman et al.
patent: 6756788 (2004-06-01), Kliman et al.
patent: 6847224 (2005-01-01), Lee et al.
patent: 6873152 (2005-03-01), Kliman et al.
patent: 2003/0117144 (2003-06-01), Sutton
patent: 2004/0070404 (2004-04-01), Lee et al.
patent: 1 318 411 (2003-11-01), None
patent: 2395281 (2004-05-01), None
patent: 2082274 (1997-06-01), None
D. B. Paley, “Current Low Power Core Testing Using EL CID;” IEE Colloquium—Understanding your condition monitoring; Apr. 1999.
D. Bertenshaw et al.; “Application of the EL CID Test with Circulation Currents in Stator Windings;” Inductia, Berlin, Germany Jun. 15th-17th, 2004; pp. 128-134.
V. B. Berezhansky et al.; “Experience with Modified Iron Fault Control Technique for the Stator Cores of Electrical Machines;” Paper SPT EM 05-07-0205 accepted for presentation at the IEEE / KTH Stockholm Power Tech. Conference Stockholm, Sweden, Jun. 18-22, 1995; pp. 108-112.
Moore et al; “Electric Generators: Potential Problems and Recommended Solutions;” [online]; [retrieved on Jul. 25, 2001]; retrieved from the Internet http://www.carilec.org/Assets/Presentations%202001/Moore-Carilec-7-25-01.pdf.
Kim Dong-wook
Lee Sang Bin
Mall Waheed Tony
General Electric Company
Hollington Jermele
LandOfFree
Manual probe carriage system and method of using the same does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Manual probe carriage system and method of using the same, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Manual probe carriage system and method of using the same will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3756817