Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With rotor
Patent
1988-10-27
1989-11-28
Eisenzopf, Reinhard J.
Electricity: measuring and testing
Measuring, testing, or sensing electricity, per se
With rotor
324 73R, 324158P, G01R 3102, G01R 3128
Patent
active
048840270
ABSTRACT:
A system for testing semiconductor microchips is provided in which indivil microchips can be tested electrically and under specific thermal conditions simultaneously to determine the reliability of the microchip under operating conditions. This system is unique and economically operable so as to enable all individual chips to be tested prior to mounting in larger assemblies.
REFERENCES:
patent: 3437929 (1969-04-01), Glenn
patent: 3710251 (1973-01-01), Hagge et al.
patent: 3979671 (1976-09-01), Meeker et al.
patent: 4590422 (1986-05-01), Milligan
patent: 4616178 (1986-10-01), Thornton, Jr. et al.
patent: 4755746 (1988-07-01), Mallory et al.
Holderfield Daron C.
Martin Bernard E.
Russell Samuel S.
Bush Freddie M.
Deaton James T.
Eisenzopf Reinhard J.
Nguyen Vinh P.
The United States of America as represented by the Secretary of
LandOfFree
Manual microcircuit die test system does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Manual microcircuit die test system, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Manual microcircuit die test system will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-584584