Semiconductor device manufacturing: process – Chemical etching
Reexamination Certificate
2005-09-20
2005-09-20
Pert, Evan (Department: 2826)
Semiconductor device manufacturing: process
Chemical etching
C134S042000, C510S109000
Reexamination Certificate
active
06946396
ABSTRACT:
A semiconductor wafer cleaning formulation for use in semiconductor fabrication comprising maleic acid and ethylene urea as essential components. The preferred formulation comprises maleic acid, ethylene urea, at least one carboxylic acid except maleic acid, at least one organic amine except ethylene urea and water. The formulation can optionally comprise at least one selected from the group consisting of an organic solvent, a chelating agent and a surfactant. The formulation is suitably used for removal of residue from semiconductor wafers following a resist ashing process, particularly for removal of residue from wafers containing delicate copper interconnect and low-k or ultra low-k interlayer dielectrics structures. There is also provided a method for cleaning the wafer by using the formulation.
REFERENCES:
patent: 5334332 (1994-08-01), Lee
patent: 5792274 (1998-08-01), Tanabe et al.
patent: 5795702 (1998-08-01), Tanabe et al.
patent: 5885362 (1999-03-01), Morinaga et al.
patent: 5905063 (1999-05-01), Tanabe et al.
patent: 5968848 (1999-10-01), Tanabe et al.
patent: 6068000 (2000-05-01), Tanabe et al.
patent: 6218087 (2001-04-01), Tanabe et al.
patent: 6265309 (2001-07-01), Gotoh et al.
patent: 6268323 (2001-07-01), Honda et al.
patent: 6372050 (2002-04-01), Honda et al.
patent: 6423480 (2002-07-01), Ichiki
patent: 6440856 (2002-08-01), Bessho et al.
patent: 6638694 (2003-10-01), Ikemoto et al.
patent: 6815151 (2004-11-01), Tanabe et al.
patent: 2001/0014534 (2001-08-01), Aoki et al.
patent: 2001/0034313 (2001-10-01), Honda et al.
patent: 2003/0143495 (2003-07-01), Ishikawa et al.
patent: 2003/0186175 (2003-10-01), Ikemoto et al.
patent: 2004/0038840 (2004-02-01), Lee et al.
patent: 0 662 705 (2000-08-01), None
patent: 9-111224 (1997-04-01), None
patent: A 11-174690 (1999-07-01), None
patent: 11-323394 (1999-11-01), None
patent: A 2001-51429 (2001-02-01), None
patent: 2001-064685 (2001-03-01), None
patent: 2001-209191 (2001-08-01), None
patent: 2003-100715 (2003-04-01), None
MSDS for 2-Imidazolidinone (i.e. “ethylene urea”), downloaded from http://www.cdc.gov
iosh/rtecs
j8b290.html, 4 pages.
MSDS for “maleic acid”, downloaded from http://www.jtbaker.com/msds/englishhtml/m0325.html, 8 pages.
Fujita Yoichiro
Kobayashi Ichiro
Miyazawa Tomoe
Nissan Chemical Indusries, Ltd.
Pert Evan
LandOfFree
Maleic acid and ethylene urea containing formulation for... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Maleic acid and ethylene urea containing formulation for..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Maleic acid and ethylene urea containing formulation for... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3368967