Maintaining interatomic distance between an STM probe and a reco

Dynamic information storage or retrieval – Specific detail of information handling portion of system – Electrical modification or sensing of storage medium

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250306, G11B 900, G06K 1700

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active

058125167

ABSTRACT:
An information recording system includes a recording medium, and a probe electrode provided at a location opposed to the recording surface of the recording medium. The probe electrode is capable of recording on the recording medium by application of a voltage between the probe electrode and the recording medium. An elastic member supports the probe electrode for motion relative to a base member arranged perpendicular to the recording surface. The distance between the recording surface and the probe electrode is adjustable by a mechanism provided for that purpose. The displacement of the probe electrode caused by an interatomic force acting between the recording medium and the probe electrode is detected, and a displacement signal based on the detected displacement is output. A control circuit feeds back the displacement signal so that the probe electrode can move back to its original position.

REFERENCES:
patent: 3833894 (1974-09-01), Aviram et al.
patent: 4032901 (1977-06-01), Levinthal
patent: 4340953 (1982-07-01), Iwamura et al.
patent: 4534015 (1985-08-01), Wilson
patent: 4575822 (1986-03-01), Quate
patent: 4724318 (1988-02-01), Bennig
patent: 4813016 (1989-03-01), Okada et al.
patent: 4829507 (1989-05-01), Kazan et al.
patent: 4831614 (1989-05-01), Duerig et al.
patent: 4851671 (1989-07-01), Pohl
patent: 4878213 (1989-10-01), Kazan et al.
patent: 4906840 (1990-03-01), Zdeblick et al.
patent: 4945515 (1990-07-01), Ooumi et al.
patent: 4962480 (1990-10-01), Ooumi et al.
patent: 4998016 (1991-03-01), Nose et al.
patent: 5152805 (1992-10-01), Geddes et al.
patent: 5182724 (1993-01-01), Yanagisawa et al.
patent: 5187367 (1993-02-01), Miyazaki et al.
patent: 5453970 (1995-09-01), Rust et al.
patent: 5513168 (1996-04-01), Fujihira et al.
patent: 5535185 (1996-07-01), Kishi et al.
patent: 5546374 (1996-08-01), Kuroda et al.
Stern et al., "Deposition and Imaging of Localized Charge no Insulator Surfaces Uing Force Microscope", Applied Physics Letter 53(26) Dec. 26, 1988, pp. 2717-2719, Dec. 1988.

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