Magnetostrictive waveguide position measurement apparatus with p

Electricity: measuring and testing – Magnetic – Displacement

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

32420712, 73290V, 333148, G01B 714, G01F 2330, H03H 922

Patent

active

058217436

ABSTRACT:
A magnetostrictive waveguide position measuring apparatus includes a waveguide extending between opposed anchored ends. A magnet is displaceable along the waveguide and generates torsional strain in the waveguide in response to an electrical excitation signal transmitted along the waveguide. A piezoceramic element sensor is coupled to the waveguide to sense the torsional strain signal on the waveguide. A signal processor determines the relative elapsed time between the excitation signal and the output signal of the piezoceramic element to determine the position of the magnet along the waveguide. The sensor is coupled to the waveguide by a low resonance coupling medium. A differential piezoceramic element is formed of two piezoceramic elements, each coupled to the waveguide by individual coupling media, with the two elements connected in a differential parallel configuration and mechanically stressed out of phase to double the output current of the piezoceramic element or connected in a differential series configuration and mechanically stressed out of places to double the output voltage of the piezoceramic element.

REFERENCES:
patent: 3703681 (1972-11-01), Johnson et al.
patent: 4839590 (1989-06-01), Koski et al.
patent: 4943773 (1990-07-01), Koski et al.
patent: 5017867 (1991-05-01), Dumais et al.
patent: 5050430 (1991-09-01), Begin et al.
patent: 5196791 (1993-03-01), Dumais
patent: 5212444 (1993-05-01), Abramovich et al.
patent: 5258707 (1993-11-01), Begin et al.
patent: 5274328 (1993-12-01), Begin et al.
patent: 5313160 (1994-05-01), Gloden et al.
patent: 5406200 (1995-04-01), Begin et al.
patent: 5412316 (1995-05-01), Dumais et al.
patent: 5473245 (1995-12-01), Silvus, Jr. et al.
patent: 5545984 (1996-08-01), Gloden et al.
patent: 5590091 (1996-12-01), Gloden et al.
Defination of Piezo Film Polarity, Amp. Inc. Appln Note 65773, Published Feb. 1, 1994, Revision B.
Retention of PVDF Piezo Activity, Amp. Inc. Appln Note 65802, Published Feb. 1, 1994, Revision B.
Piezo Film Sensors Technical Manual (pp. 7, 21-31), Amp. Inc. Appln. Note 65751, Published Dec. 93.
Wire Lead Attach-DT Senor LDTI-028K, Amp. Inc., Instruction Sheet 408-9939, Pub. Mar. 1, 1994, Revision C.
Application Notes, Piezoceramics, Piezo Kinetics Inc.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Magnetostrictive waveguide position measurement apparatus with p does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Magnetostrictive waveguide position measurement apparatus with p, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Magnetostrictive waveguide position measurement apparatus with p will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-316292

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.