Magnetostrictive waveguide position measurement apparatus using

Details Magnetostrictive waveguide position measurement apparatus using Magnetostrictive waveguide position measurement apparatus using

1996-10-28

1998-09-08

O'Shea, Sandra L.

Electricity: measuring and testing

Magnetic

Displacement

32420722, 32420724, G01B 714

Patent

active

058049614

ABSTRACT:
A magnetostrictive waveguide position measuring apparatus includes a waveguide extending between opposed anchored ends. A magnet is displaceable along the waveguide and generates torsional strain in the waveguide in response to an electrical excitation signal transmitted along the waveguide. A piezoelectric film element is coupled to the waveguide to sense the torsional strain signal on the waveguide. A signal processor determines the relative elapsed time between the excitation signal and the output signal of the piezoelectric film element to determine the position of the magnet along the waveguide. The piezoelectric film element is coupled to the waveguide along an axis transverse to the axis of stretch of the element. Alternately, a differential piezoelectric film element formed of two piezoelectric elements contacts a waveguide, with the two elements connected in differential parallel or series configuration and in or out of phase to double the output current or the output voltage. The output of the differential piezoelectric elements are connected to an amplifier in either charge or voltage mode for noise, EMI and transient signal suppression.

REFERENCES:
patent: 3703681 (1972-11-01), Johnson et al.
patent: 3898855 (1975-08-01), Tellerman
patent: 4678993 (1987-07-01), Vinnemann et al.
patent: 4709210 (1987-11-01), Pond
patent: 4839590 (1989-06-01), Koski et al.
patent: 4939457 (1990-07-01), Tellerman
patent: 4943773 (1990-07-01), Koski et al.
patent: 4958332 (1990-09-01), Tellerman
patent: 5017867 (1991-05-01), Dumais et al.
patent: 5050430 (1991-09-01), Begin et al.
patent: 5076100 (1991-12-01), Hunter et al.
patent: 5173658 (1992-12-01), Astrachan et al.
patent: 5196791 (1993-03-01), Dumais
patent: 5212444 (1993-05-01), Abramovich et al.
patent: 5258707 (1993-11-01), Begin et al.
patent: 5274328 (1993-12-01), Begin et al.
patent: 5313160 (1994-05-01), Golden et al.
patent: 5406200 (1995-04-01), Begin et al.
patent: 5412316 (1995-05-01), Dumais et al.
patent: 5473245 (1995-12-01), Silvus, Jr. et al.
patent: 5545984 (1996-08-01), Gloden et al.
Defination of Piezo Film Polarity, AMP Inc Appln. Note 65773, Published Feb. 1, 1994, Revision B.
Retention of PVDF Piezo Activity, AMP, Inc., Appln Note 65802, Published Feb. 1, 1994, Revision B.
Piezo Film Sensors Technical Manual (pp. 7, 21-31), AMP. Inc, Appln Note 65751, Published Dec. 1993.
Wire Lead Attach-DT1 Sensor LDT 1-028K, AMP Inc., Instruction Sheet 408-9939, Pub. Mar. 1, 1994, Revision C. p. 1.
The Piezoelectric Effect, Application Notes, Piezo Kinetics Inc p. 8.

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