Magnetoresistive element lifecycle tester

Details Magnetoresistive element lifecycle tester Magnetoresistive element lifecycle tester

2005-09-13

2005-09-13

Patidar, Jay (Department: 2862)

Electricity: measuring and testing

Magnetic

Magnetic information storage element testing

C324S209000

Reexamination Certificate

active

06943546

ABSTRACT:
A lifecycle analyzer includes a heating element for heating a plurality of magnetoresistive (MR) elements, which maybe, e.g., in bar form. At one location the MR elements are in contact with a stress probe card for applying a bias voltage or current stress. The MR elements are moved to a separate location, where there is a test probe card and magnetic field generator for testing the MR elements after being stressed. In one embodiment, a subset of the plurality of MR elements is tested at a time. The lifecycle analyzer includes an in-situ abrasive element that is used to abrade the probe pins of the stress probe card to remove oxidation that results from extended contact with the heated MR elements.

REFERENCES:
patent: 5670889 (1997-09-01), Okubo et al.
Advanced Probing System, Inc. , “Effects of ‘On the Shelf’ Probe Tip Oxidation on Contact Resistance”, Technical Bulletin—Jul. 1999, 1 page.

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