Magnetoresistance effect film, a method of manufacturing the sam

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428692, 428694R, 428694T, 428694TR, 428694TS, 428694TM, 428336, 428900, 360113, 338 32R, 324252, G11B 566

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059896906

ABSTRACT:
Magnetic thin films 2 and 3 are stacked on a substrate 4 with a nonmagnetic thin film 1 interposed therebetween. An antiferromagnetic thin film 5 is arranged adjacent to one magnetic thin film 3. The inequality Hc.sub.2 <Hr is satisfied between a bias magnetic field Hr of the antiferromagnetic thin film 5 and coercive force Hc.sub.2 of the other magnetic thin film 2. At least a part of the antiferromagnetic thin film 5 comprises NiMn of an fct structure. Alternatively, the antiferromagnetic thin film 5 comprises a two-layer structure composed of a CoO layer deposited on a NiO layer to a thickness between 10 and 40 angstroms.

REFERENCES:
patent: 5549978 (1996-08-01), Iwasaki

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