Magnetoresistance effect element comprising nano-contact...

Dynamic magnetic information storage or retrieval – Head – Magnetoresistive reproducing head

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C360S324100, C360S324200

Reexamination Certificate

active

07068479

ABSTRACT:
A magnetoresistance effect element is composed of a substrate, and a layer lamination structure disposed on the substrate and comprising a buffer layer, an anti-ferromagnetic layer, a pinned layer, an insulating layer including at least one nano-contact portion having a dimension of not more than Fermi length, a free layer composed of a ferromagnetic layer and a domain stability layer, which are laminated in the described order on the substrate. The pinned layer is composed of a first ferromagnetic layer, a non-magnetic layer and a second ferromagnetic layer disposed in this order on the side of the anti-ferromagnetic layer, and the domain stability control including a non-magnetic layer, a ferromagnetic layer and an anti-ferromagnetic layer disposed in this order from the side of the free layer.

REFERENCES:
patent: 5715121 (1998-02-01), Sakakima et al.
patent: 5936402 (1999-08-01), Schep et al.
patent: 6046891 (2000-04-01), Yoda et al.
patent: 6052262 (2000-04-01), Kamiguchi et al.
patent: 6077618 (2000-06-01), Sakakima et al.
patent: 6452764 (2002-09-01), Abraham et al.
patent: 6590750 (2003-07-01), Abraham et al.
patent: 6731475 (2004-05-01), Ikeda
patent: 6804090 (2004-10-01), Kokado
patent: 6933042 (2005-08-01), Gill
patent: 2003/0104249 (2003-06-01), Okuno et al.
patent: 11-510911 (1999-09-01), None
patent: 2003-204095 (2003-07-01), None
N. Garcia, et al., Magnetoresistance In Excess Of 200% In Ballistic Ni Nanocontacts At Room Temperature And 100 Oe, Physical Review Letters, Apr. 5, 1999, 2923-2926, vol. 82, No. 14, © 1999 The American Physical Society.
N. Garcia, et al., Ballistic Magnetoresistance In Nanocontacts Electrochemically Grown Between Macro- and Microscopic Ferromagnetic Electrodes, Applied Physics Letters, Mar. 11, 2002, 1785-1787, vol. 80, No. 10, © American Institute of Physics.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Magnetoresistance effect element comprising nano-contact... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Magnetoresistance effect element comprising nano-contact..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Magnetoresistance effect element comprising nano-contact... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3710467

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.