Magnetoresistance effect device and magnetism sensor using...

Active solid-state devices (e.g. – transistors – solid-state diode – Responsive to non-electrical signal – Magnetic field

Reexamination Certificate

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C257SE43002, C257SE29323, C360S324100, C438S003000

Reexamination Certificate

active

07964924

ABSTRACT:
A magneto-resistance effect device (1) includes a semiconductor region (2) having a surface provided with a plurality of isolated metal micro-particles (3) of not more than 100 μm disposed at intervals of not more than 1 μm, a semiconductor or half-metal cap layer (4) for covering the semiconductor region and a plurality of electrodes (5) disposed on a surface of the cap layer and separated from each other. The device exhibits a high magneto-resistance effect at room temperature, is highly sensible to a magnetic field and can be produced through a simple manufacturing process. The device is formed of a magneto-resistant material easy to match a semiconductor fabrication process. A magnetic field sensor using the device (1) has various excellent characteristics.

REFERENCES:
patent: 4288708 (1981-09-01), Vinal
patent: 5783284 (1998-07-01), Shinjo et al.
patent: 6016241 (2000-01-01), Coffey et al.
patent: 6146761 (2000-11-01), Hirotsu et al.
patent: 6162532 (2000-12-01), Black et al.
patent: 6353317 (2002-03-01), Green et al.
patent: 6381171 (2002-04-01), Inomata et al.
patent: 6610421 (2003-08-01), Akinaga et al.
patent: 6613448 (2003-09-01), Akinaga et al.
patent: 6808740 (2004-10-01), Akinaga et al.
patent: 7180713 (2007-02-01), Nagasaka et al.
patent: 7304331 (2007-12-01), Saito et al.
patent: 7352024 (2008-04-01), Iwata et al.
patent: 2002/0030950 (2002-03-01), Sano et al.
patent: 2000340425 (2000-08-01), None
patent: 2000-340425 (2000-12-01), None
patent: 2001-108951 (2001-04-01), None
patent: 2002-164589 (2002-06-01), None
Prabhawalker et al. (“Electron Diffraction Analysis of Antimony Films”, Bull. Mater. Sci., vol. 6, No. 3, Jul. 1984, pp. 611-616).
Tadayon et al. (“Characterization of Low Range GaAs”, J. of Electronic Materials, vol. 24, No. 11, 1995).
Akinaga, H. et al. “Room-temperature thousandfold magnetoresistance change in MnSb granular films: Magnetoresistive switch effect”, Applied Physics Letters, vol. 76, No. 3, pp. 357-359, Jan. 2000.
Akinaga, H. et al. “Room-temperature photoinduced magnetoresistance effect in GaAs including MnSb nanomagnets”, Applied Physics Letters, vol. 76, No. 18, pp. 2600-2602, May 2000.
Akinaga, H. et al. “Room-temperature thousandfold magnetoresistance change in MnSb granular films: Magnetoresistive switch effect”, Applied Physics Letters, vol. 76, No. 3, pp. 357-359, Jan. 2000.
Mizuguchi, M. et al. “Crystallographic and magneto-optical studies of nanoscaled MnSb dots grown on GaAs”, Applied Physics Letters, vol. 76, No. 13, pp. 1743-1745, Mar. 2000.
Akinaga, H. et al. “Room-temperature photoinduced magnetoresistance effect in GaAs including MnSb nanomagnets”, Applied Physics Letters, vol. 76, No. 18, pp. 2600-2602, May 2000.
Akinaga, H. et al. “Room-Temperature Extra-huge Magnetoresistance Effect in MnSb Granular Films”, Journal of Applied Magnetism, vol. 24, No. 4-2, pp. 451-454, with English translation 2000.
Mizuguchi, M. et al. “Formation of MnSb Granular Films and Their Magneto-optical Properties”, Journal of Applied Magnetism, vol. 24, No. 4-2, pp. 499-502, with English translation 2000.
Pauw, L.J. van der. “A Method of Measuring the Resistivity and Hall Coefficient on Lamellae of Arbitrary Shape”, Philips Technical Review, vol. 20, No. 8, pp. 220-224 1958/1959.
Behet, M. et al. “InAs/(AI,Ga)Sb Quantum Well Structures for Magnetic Sensors”, IEEE Transactions on Magnetics, vol. 34, No. 4, pp. 1300-1302, Jul. 1998.

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