Optics: measuring and testing – By polarized light examination
Reexamination Certificate
2007-09-18
2007-09-18
Punnoose, Roy M. (Department: 2886)
Optics: measuring and testing
By polarized light examination
C356S237200
Reexamination Certificate
active
10562560
ABSTRACT:
A quantitative magneto-optical imaging method is used to form an image of a target material. An active material is placed close to the target material and produces a Faraday rotation in a polarized light beam. The Faraday rotation of the active material is essentially proportional to the magnetization of the target material when this latter is subjected to an exciting magnetic field. Photodetector means detect the beam reflected after passing through the active material. The light from the reflected beam can then be analyzed for obtaining the amplitude and phase of an interfering magnetic field generated by a defect in the target material.
REFERENCES:
patent: 4410277 (1983-10-01), Yamamoto et al.
patent: 4625167 (1986-11-01), Fitzpatrick
patent: 4755752 (1988-07-01), Fitzpatrick
patent: 4896103 (1990-01-01), Shimanuki et al.
patent: 5053704 (1991-10-01), Fitzpatrick
patent: 5446378 (1995-08-01), Reich et al.
patent: 40 21 359 (1992-01-01), None
patent: 0 351 171 (1990-01-01), None
patent: 0 510 621 (1992-10-01), None
patent: 01209356 (1989-08-01), None
Preliminary French Search Report FR 0307850; report dated Feb. 27, 2004.
International Search Report PCT/FR2004/001602; report dated Dec. 29, 2004.
Decitre Jean-Marc
Joubert Pierre-Yves
Lemistre Michel
Lepoutre Francois
Placko Dominique
Centre National De La Recherche Scientifique (CNRS)
Miller Matthias & Hull
Punnoose Roy M.
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