Dynamic information storage or retrieval – Storage or retrieval by simultaneous application of diverse... – Magnetic field and light beam
Reexamination Certificate
2011-06-21
2011-06-21
Haley, Joseph (Department: 2627)
Dynamic information storage or retrieval
Storage or retrieval by simultaneous application of diverse...
Magnetic field and light beam
C369S013220, C369S126000
Reexamination Certificate
active
07965586
ABSTRACT:
A detection method and apparatus for reading magnetization information recorded in high density. A metal probe is brought close to the surface of a magnetic recording medium, in which information is recorded as magnetization, with the distance on the order of nanometers. The region is irradiated with an incident light as its polarization direction is modulated, and polarization dependency of a tunnel current or reflected polarization intensity is measured.
REFERENCES:
patent: 5949600 (1999-09-01), Akiyama et al.
patent: 6046448 (2000-04-01), Sato et al.
patent: 6795380 (2004-09-01), Akiyama et al.
patent: 2004/0027929 (2004-02-01), Fujimaki et al.
patent: 2004/0218504 (2004-11-01), Kim et al.
patent: 2004/0228024 (2004-11-01), Ogawa et al.
patent: 2005/0128886 (2005-06-01), Ogawa et al.
patent: 05-250735 (1992-03-01), None
patent: 2005-108302 (2005-04-01), None
N. Kroo et al., “Decay Length of Surface Plasmons Determined with a Tunnelling Microscope”, Europhysics Letters, vol. 15, No. 3, Jun. 1991, pp. 289-293.
Office Action from the Japanese Patent Office in the corresponding Japanese Patent Application No. 2005-290255 (2 pages) dated Dec. 21, 2010.
Ogawa Susumu
Takahashi Hiromasa
A. Marquez, Esq. Juan Carlos
Haley Joseph
Hitachi , Ltd.
Lee Nicholas
Stites & Harbison PLLC
LandOfFree
Magnetization detecting method and apparatus does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Magnetization detecting method and apparatus, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Magnetization detecting method and apparatus will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2716319