Magnetic tunneling junction antifuse device

Semiconductor device manufacturing: process – Making device array and selectively interconnecting – Using structure alterable to conductive state

Reexamination Certificate

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Details

C438S467000, C438S600000, C257S530000, C257SE23147, C257S295000, C257S421000

Reexamination Certificate

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11123916

ABSTRACT:
An MRAM device having a plurality of MRAM cells formed of a fixed magnetic layer, a second soft magnetic layer and a dielectric layer interposed between the fixed magnetic layer and the soft magnetic layer. The MRAM cells are all formed simultaneously and at least some of the MRAM cells are designed to function as antifuse devices whereby the application of a selected electrical potential can short the antifuse device to thereby affect the functionality of the MRAM device.

REFERENCES:
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patent: 6473337 (2002-10-01), Tran et al.
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patent: 6501679 (2002-12-01), Hidaka
patent: 6567287 (2003-05-01), Scheuerlein
patent: 6618295 (2003-09-01), Scheuerlein
patent: 2002/0080646 (2002-06-01), Hidaka
patent: 2002/0136047 (2002-09-01), Scheuerlein
patent: 2003/0179601 (2003-09-01), Seyyedy et al.
patent: 2004/0027854 (2004-02-01), Iwata et al.

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