Semiconductor device manufacturing: process – Making device array and selectively interconnecting – Using structure alterable to conductive state
Reexamination Certificate
2007-02-13
2007-02-13
Ho, Tu-Tu (Department: 2818)
Semiconductor device manufacturing: process
Making device array and selectively interconnecting
Using structure alterable to conductive state
C438S467000, C438S600000, C257S530000, C257SE23147, C257S295000, C257S421000
Reexamination Certificate
active
11123916
ABSTRACT:
An MRAM device having a plurality of MRAM cells formed of a fixed magnetic layer, a second soft magnetic layer and a dielectric layer interposed between the fixed magnetic layer and the soft magnetic layer. The MRAM cells are all formed simultaneously and at least some of the MRAM cells are designed to function as antifuse devices whereby the application of a selected electrical potential can short the antifuse device to thereby affect the functionality of the MRAM device.
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Hush Glen E.
Seyyedy Mirmajid
Tuttle Mark E.
Ho Tu-Tu
Knobbe Martens & Olson Bear LLP.
Micro)n Technology, Inc.
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