Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With coupling means
Reexamination Certificate
2011-04-12
2011-04-12
Nguyen, Ha Tran T (Department: 2829)
Electricity: measuring and testing
Measuring, testing, or sensing electricity, per se
With coupling means
C324S750210, C324S754170
Reexamination Certificate
active
07923987
ABSTRACT:
A magnetic sensor integrated circuit includes a plurality of magnetically sensitive elements, and at least one test conductor positioned adjacent to at least one of the magnetically sensitive elements and configured to generate a differential magnetic field that is adapted to be applied to the plurality of magnetically sensitive elements during a test mode.
REFERENCES:
patent: 5521501 (1996-05-01), Dettmann et al.
patent: 5796249 (1998-08-01), Andraet et al.
patent: 6069476 (2000-05-01), Vieux-Rochaz et al.
patent: 6246233 (2001-06-01), Griffen et al.
patent: 6300758 (2001-10-01), Griffen et al.
patent: 6501678 (2002-12-01), Lenssen et al.
patent: 6674280 (2004-01-01), Goetz et al.
patent: 6731105 (2004-05-01), Hoyle et al.
patent: 6882146 (2005-04-01), Maiwald
patent: 7030601 (2006-04-01), Buchhold
patent: 7208944 (2007-04-01), Tatschl et al.
patent: 7231325 (2007-06-01), Motz et al.
patent: 2001/0009367 (2001-07-01), Seitzer et al.
patent: 2005/0278136 (2005-12-01), Werth
patent: 2006/0202692 (2006-09-01), Tatschl et al.
patent: 2007/0164734 (2007-07-01), Shimizu et al.
patent: 2008/0274270 (2008-11-01), Wakui et al.
patent: 2008/0285179 (2008-11-01), Yamashita
patent: 2009/0243607 (2009-10-01), Mather et al.
patent: 2 083 008 (1992-11-01), None
patent: 4121374 (1993-07-01), None
patent: 4319146 (1994-12-01), None
patent: 19520206 (1996-12-01), None
patent: 10220911 (2003-12-01), None
patent: 103 26 988 (2005-04-01), None
patent: 102005047413 (2006-09-01), None
patent: 9848291 (1998-10-01), None
Infineon Technologies, Data Book entitles “6.6 Application Notes: Differentail Hall IC TLE 4921-3U, ” Jul. 2000; pp. 31-51.
Infineon Technologies, Target Data Sheet entitled “TLE 5011 GMR Based Angular Sensor,” V.01, Apr. 2007; 56 pgs.
Infineon Technologies, Preliminary Data Sheet entitled “TLE 5010 GMR Based Angular Sensor,” V.09, May 2007; 56 pgs.
J. Zimmer, US application entitled “Integrated Circuit Including Magneto-Resistive Structures, ” U.S. Appl. 11/845,440, filed Aug. 27, 2007.
Dicke Billig & Czaja, PLLC
Infineon - Technologies AG
Nguyen Ha Tran T
Nguyen Trung Q
LandOfFree
Magnetic sensor integrated circuit with test conductor does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Magnetic sensor integrated circuit with test conductor, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Magnetic sensor integrated circuit with test conductor will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2699479