Semiconductor device manufacturing: process – Having magnetic or ferroelectric component
Reexamination Certificate
2006-08-22
2006-08-22
Dickey, Thomas L. (Department: 2826)
Semiconductor device manufacturing: process
Having magnetic or ferroelectric component
C257S421000, C257S075000, C365S158000, C365S171000, C365S175000
Reexamination Certificate
active
07094610
ABSTRACT:
A magnetic sensor using efficient injection of spin polarized electrons at room temperature can be fabricated by forming a semiconductor layer sandwiched between ferromagnets and forming δ-doped layers between the semiconductor layer and the ferromagnets. A sensing method applies a magnetic field to be measured to the semiconductor layer and observes the conductivity of the sensor. The sensing techniques can achieve high magneto-sensitivity and very high operating speed, which in turn provides ultra fast and sensitive magnetic sensors.
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Albrecht, J.D. et al, “Electron Spin Injection at a Schottky Contact” cond-mat/0110059, (a publication of ArXiv.org, available at http://arHiv.org/PS—cache/cond-mat/pdf/0202/0202131.pdf.arHiv.org is owned, operated and funded by Cornell University) (Feb. 7, 2002).
Zhu, H.J. et al., “Room Temperature Spin Injection from Fe into GaAs” Phys. Rev. Lett. vol. 87, No. 1, pp. 016601.1 to 016601-4 (Jul. 2, 2001).
Bratkovski Alexandre M.
Osipov Viatcheslav V.
Dickey Thomas L.
Hewlett--Packard Development Company, L.P.
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