Electricity: measuring and testing – Magnetic – Magnetometers
Reexamination Certificate
2007-03-06
2007-03-06
Pert, Evan (Department: 2826)
Electricity: measuring and testing
Magnetic
Magnetometers
C324S247000, C324S249000
Reexamination Certificate
active
10846554
ABSTRACT:
On a single chip are formed a plurality of magnetoresistance effect elements provided with pinned layers having fixed magnetization axes in the directions that cross each other. On a substrate10are formed magnetic layers that will become two magnetic tunnel effect elements11, 21as magnetoresistance effect elements. Magnetic-field-applying magnetic layers made of NiCo are formed to sandwich the magnetic layers in plan view. A magnetic field is applied to the magnetic-field-applying magnetic layers. The magnetic field is removed after the magnetic-field-applying magnetic layers are magnetized in the direction shown by arrow A. As a result of this, by the residual magnetization of the magnetic-field-applying magnetic layers, magnetic fields in the directions shown by arrows B are applied to the magnetic layers that will become magnetic tunnel effect elements11, 21, whereby the magnetization of the pinned layers of the magnetic layers that will become magnetic tunnel effect elements11, 21is pinned in the directions shown by arrows B.
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Yamaha Corporation
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