Electricity: measuring and testing – Particle precession resonance – Using a nuclear resonance spectrometer system
Patent
1986-06-02
1988-02-09
Levy, Stewart J.
Electricity: measuring and testing
Particle precession resonance
Using a nuclear resonance spectrometer system
324312, 324318, G01R 3320
Patent
active
047243880
ABSTRACT:
In order to measure a static field distribution with one scanning operation and to make image distortion corrections with the static field distribution and a gradient field distribution simultaneously considered, an image is reconstructed using a spin echo signal produced under the condition that a time interval between a 90.degree. pulse and a 180.degree. pulse differs from an interval between the 180.degree. pulse and the time origin of the spin echo signal, the static field distribution is evaluated from the relation of distortions to phase errors free from a phase distortion attributed to the characteristic of a detecting part and a phase distortion attributed to the dynamic characteristic of the gradient field, a relations existing between the spatial distortion and phase distortion of the reconstructed image and a magnetic field distribution including the gradient field is obtained, and the distortion magnitude of the reconstructed image is evaluated from the measured magnetic field distribution.
REFERENCES:
patent: 3824452 (1974-07-01), Freeman et al.
patent: 3968424 (1976-07-01), Ernst
patent: 4591789 (1986-05-01), Glover et al.
patent: 4611172 (1986-09-01), Takase
patent: 4625171 (1986-11-01), Sekihara et al.
Koizumi Hideaki
Sano Koichi
Yokoyama Tetsuo
Hitachi , Ltd.
Levy Stewart J.
O'Shea Kevin D.
LandOfFree
Magnetic resonance imaging method does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Magnetic resonance imaging method, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Magnetic resonance imaging method will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-1285173