Semiconductor device manufacturing: process – Making device or circuit responsive to nonelectrical signal – Responsive to electromagnetic radiation
Reexamination Certificate
2007-02-27
2007-02-27
Whitehead, Jr., Carl (Department: 2813)
Semiconductor device manufacturing: process
Making device or circuit responsive to nonelectrical signal
Responsive to electromagnetic radiation
C438S015000, C438S057000, C438S728000, C438S732000
Reexamination Certificate
active
10604533
ABSTRACT:
A device structure and method for forming an interconnect structure in a magnetic random access memory (MRAM) device. In an exemplary embodiment, the method includes defining a magnetic stack layer on a lower metallization level, the magnetic stack layer including a non-ferromagnetic layer disposed between a pair of ferromagnetic layers. A conductive hardmask is defined over the magnetic stack layer, and selected portions of the hardmask and the magnetic stack layer, are then removed, thereby creating an array of magnetic tunnel junction (MTJ) stacks. The MTJ stacks include remaining portions of the magnetic stack layer and the hardmask, wherein the hardmask forms a self aligning contact between the magnetic stack layer and an upper metallization level subsequently formed above the MTJ stacks.
REFERENCES:
patent: 5695810 (1997-12-01), Dubin et al.
patent: 5804458 (1998-09-01), Tehrani et al.
patent: 5920500 (1999-07-01), Tehrani et al.
patent: 5936293 (1999-08-01), Parkin
patent: 6048739 (2000-04-01), Hurst et al.
patent: 6147900 (2000-11-01), Pohm
patent: 6165803 (2000-12-01), Chen et al.
patent: 6351408 (2002-02-01), Schwarzl et al.
patent: 6365419 (2002-04-01), Durlam et al.
patent: 6381170 (2002-04-01), Prinz
patent: 6396735 (2002-05-01), Michijima et al.
patent: 6417561 (2002-07-01), Tuttle
patent: 6452764 (2002-09-01), Abraham et al.
patent: 6706639 (2004-03-01), Parker et al.
patent: 6783995 (2004-08-01), Hineman et al.
patent: 6783999 (2004-08-01), Lee
patent: 6784091 (2004-08-01), Nuetzel et al.
patent: 6815784 (2004-11-01), Park et al.
patent: 6884630 (2005-04-01), Gupta et al.
patent: 6977401 (2005-12-01), Hosotani
patent: 2002/0098676 (2002-07-01), Ning et al.
patent: 2002/0155627 (2002-10-01), Okazawa et al.
patent: 2002/0171100 (2002-11-01), Pohm
patent: 2003/0137028 (2003-07-01), Hosotani et al.
patent: 2003/0234449 (2003-12-01), Aratani et al.
patent: 2004/0018645 (2004-01-01), Drewes
patent: 2005/0078417 (2005-04-01), Kishi et al.
L. G. Svendsen, T. Osaka, I. Koiwa, and H. Sawai; “Chemically Deposited Ni-P and Ni-P-W Layers Invetigated by Means of Rutherford Backscattering Spectrometry;” J. Electrochem. Soc.: Solid-State Science and Technology vol. 130 No. 11, Nov. 1983, pp. 2255-2259.
K. K. H. Wong, S. Kaja, P. W. DeHaven; “Metallization By Plating for High-Performance Multichip Modules,” IBM Research Development, vol. 42, No. 5, Sep. 1998; pp. 587-596.
L.A. D'Asaro, J. V. DiLorenzo, and H. Fukui; “Improved Performance of GaAs Microwave Field-Effect Transistors with Low Inductance Via Connections Through the Substrate;” IEEE Transactions on Electron Devices, vol. ED-25, No. 10, Oct. 1978; pp. 1218-1221.
T. Ishikawa, K. Okaniwa, M. Komaru, K. Kosaki, and Y. Mitsui; “A High-Power GaAs FET Having Buriied Plated Heat Sink for High-Performance MMIC's” IEEE Transactions on Electron Devices, vol. 41, No. 1; Jan. 1994; pp. 3-9.
Ning Xian Jay
Nuetzel Joachim
Wille William C.
Cantor & Colburn LLP
International Business Machines - Corporation
Mitchell James M.
LandOfFree
Magnetic random access memory and method of fabricating thereof does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Magnetic random access memory and method of fabricating thereof, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Magnetic random access memory and method of fabricating thereof will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3853718