Electricity: measuring and testing – Magnetic – Susceptibility
Patent
1992-03-18
1994-05-10
Strecker, Gerard R.
Electricity: measuring and testing
Magnetic
Susceptibility
324248, 324259, 324262, G01R 3316, G01R 33035, G01N 2772
Patent
active
053111257
ABSTRACT:
A sensing coil arrangement including a pair of sensing coils connected in opposition is used to measure AC susceptibility and, using sample movement and a DC magnetization field source, also to sense signals for absolute DC moment measurements. Since the same sensing coil arrangement is used for both AC and DC measurements, the measurements can be made successively in situ without removing the sample from a sample space (e.g., within a cryogenic chamber). This is a big advantage, because the changed conditions associated with removing and replacing a sample between measurements can cause confusing, uncorrelated results. A high speed voltmeter is used to perform the signal analysis for the moment measurement. The system can be configured to yield high resolution DC moment measurements to 25 ppm and sensitivities to better than 5.times.10.sup.-5 emu.
REFERENCES:
patent: 2975360 (1961-03-01), Bell
patent: 3454875 (1969-07-01), Bol et al.
patent: 3528001 (1970-09-01), Yntema
patent: 3665297 (1972-05-01), Yates
patent: 3863142 (1975-01-01), Werle
patent: 4005358 (1977-01-01), Foner
patent: 4037149 (1977-07-01), Foner
patent: 4134064 (1979-01-01), Jacobs et al.
patent: 4234939 (1981-01-01), Grossman et al.
patent: 4238734 (1980-12-01), Steingroever et al.
patent: 4277750 (1981-07-01), Bonnet et al.
patent: 4588947 (1986-05-01), Ketchen
patent: 4849695 (1989-07-01), Muller et al.
patent: 4861990 (1989-08-01), Coley
patent: 5008621 (1991-04-01), Jiles
Reference Material for Quantum Design's Seminar (Nov. 5-6, 1990 Seoul) Woo Sin Enterprise, Inc.
Rillo et al., "Multipurpose Cryostat for Low Temperature Magnetic and Electric Measurements of Solids," Magnetic Susceptibility of Superconductors and Other Spin Systems, Edited by R. A. Hein et al., Plenum Press, New York, pp 1-24, May 1991.
H. Sasaki, "A Simple Precision Fluxmeter," Aug. 1969, pp. 100-102 (North-Holland Publishing Co.), vol. 76 Nieder Instr. and Methods.
C. Edwards, et al., "A Magnetometer for Surface Flux Density Measurement in MPI," Sep. 1987, pp. 304-306 (British Journal of NDT).
P. Beckley, et al., "A simplified electronic permeameter suitable for routine and standards use," 1976, pp. 379-384 (Mesasurment and Control), Oct. 1976.
L. F. Marinaccio, "Op amp converts DVM to fluxmeter," May, 1975, pp. 112-113 (Electronics).
E. G. DeMott, "Integrating Fluxmeter wtih Digital Readout," Jun., 1970, pp. 269-271 (IEEE Transactions on Magnetics).
E. Seeley, "Dowty RFL Offers the Only Digital Fluxmeter with IEEE-488 Bus Operation," 1986 (Dowty RFL Industries) Mar. 1986.
Lake Shore Cryotronics, Inc. Brochure, "AC Susceptibility Measurement--Its Purpose and Process," Nov. 1988.
C. Rillo, et al., "On the Sensitivity of High-TC Suerpconducting . . . Sensors," 1991, pp. 775-780 (Sensors and Actuators A-Physical) vol. 27. (no month).
B. D. Cullity, "Introduction to Magnetic Materials," pp. 65-66 (Addision-Wesley Publishing Company) (No month) 1972, first Ed.
Quantum Design Brochure, "MPMS2 AC Measurement and Field Cancelling Options," 2 pages. Aug. 1990.
R. B. Goldfarb, et al., "Alternating-Field Susceptometry and Magnetic Susceptibility of Superconductors," pp. 1-32 (Plenum Press) May 1991.
J. Rebouillat, "High Resolution Automatic Magnetometer . . . Measurements", Sep. 1972, pp. 630-633 (IEEE Transactions on Magnetics).
Dodrill Bradley C.
Krause John K.
Wang Victor
Edmonds Warren S.
Lake Shore Cryotronics, Inc.
Strecker Gerard R.
LandOfFree
Magnetic property characterization system employing a single sen does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Magnetic property characterization system employing a single sen, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Magnetic property characterization system employing a single sen will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2414677