Magnetic property characterization system employing a single sen

Electricity: measuring and testing – Magnetic – Susceptibility

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

324248, 324262, 324259, 324224, G01R 3316, G01R 33035, G01N 2771, G01N 2772

Patent

active

055065007

ABSTRACT:
A coil arrangement having a primary and two balanced secondaries is used to measure ac susceptibility and, using sample movement, also to perform absolute dc moment measurements. Since the same coil arrangement is used for both AC and DC measurements, the measurements can be made successively within a cryogenic chamber without removing the sample. This is a big advantage, because the changed conditions associated with removing and replacing a sample between measurements can cause confusing, uncorrelated results. A high speed voltmeter is used to perform the signal analysis for the moment measurement. The system can be configured to yield high resolution dc moment measurements to 25 ppm and sensitivities to better than 5.times.10.sup.-5 emu.

REFERENCES:
patent: 2975360 (1961-03-01), Bell
patent: 3454875 (1969-07-01), Bol et al.
patent: 3528001 (1970-09-01), Yntema
patent: 3665297 (1972-05-01), Yates
patent: 3863142 (1975-01-01), Werle
patent: 4005358 (1977-01-01), Foner
patent: 4037149 (1977-07-01), Foner
patent: 4134064 (1979-01-01), Jacobs et al.
patent: 4234939 (1981-01-01), Grossman et al.
patent: 4238734 (1980-12-01), Steingroever et al.
patent: 4277750 (1981-07-01), Bonnet et al.
patent: 4588947 (1986-05-01), Ketchen
patent: 4849695 (1989-07-01), Muller et al.
patent: 4861990 (1989-08-01), Coley
patent: 5008621 (1991-04-01), Jiles
B. D. Cullity, "Introduction to Magnetic Materials," pp. 65-66 (Addison-Wesley Publishing Company), (No Month) 1972.
Quantum Design Brochure, "MPMS2 AC Measurement and Field Cancelling Options," 2 pages, Aug. 1990.
R. B. Goldfarb, et al., "Alternating-Field Susceptometry and Magentic Susceptibility of Superconductors," pp. 1-32 (Plemum Press), May 1991.
J. Rebouillat, "High Resolution Automatic Magnetometer . . . Measurements," pp. 630-633 (IEEE Transactions on Magnetics), Sep. 1972.
Reference Material for Quantum Design's Seminar (Nov. 5-6, 1990 Seoul) Woo Sin Enterprise, Inc.
Rillo et al., "Multipurpose Cryostat for Low Temperature Magnetic and Electric Measurements of Solids," Magnetic Susceptibility of Superconductors and Other Spin Systems, Edited by R. A. Hein et al., Plenum Press, New York, pp. 1-24, May 1991.
C. Rillo, et al., "Multipurpose a.c. and d.c. Equipment . . . Measurements of Solids", May 1991.
H. Sasaki, "A Simple Precision Fluxmeter," pp. 100-102 (North-Holland Publishing Co.), Aug., 1969.
C. Edwards, et al., "A Magnetometer for Surface Flux Density Measurement in MPI," pp. 304-306 (British Journal of NDT), Sep. 1987.
P. Beckley, et al., "A Simplified electronic permeameter suitable for routine and standards use," pp. 379-384 (Measurement and Control), Oct., 1976.
L. F. Marinaccio, "Op amp converts DVM to fluxmeter," pp. 112-113 (Electronics), May, 1975.
E. G. DeMott, "Integrating fluxmeter with Digital Readout," pp. 269-271 (IEEE Transactions on Magnetics), Jun., 1970.
E. Seely, "Dowty RFL Offers the Only Digital Fluxmeter With IEEE-488 Bus Operation," (Dowty RFL Industries), Mar., 1986.
Lake Shore Cryotronics, Inc. Brochure, "AC Susceptibility Measurement--Its Purpose and Process," Nov. 1988.
C. Rillo, et al., "On the Sensitivity of High-TC Superconducting . . . Sensors," pp. 775-780 (Sensors and Actuators A-Physical), (No Month) 1991.
Bartolome, "Thermal, Magnetic, Magnetoelastic and Transport Characterization of Hard Magnetic Alloys," Supermagnets, Hard Magnetic Materials, Proceeedings of the NATO Advanced Study Institute on Supermagnets, Hard Magnetic Materials, II Ciocco, Italy Jun. 10-22, 1990, pp. 391-413, published by Kluwer Academic Publishers.
Broersma, "Inductance Apparatus for Diamagnetic Measurements," The Review of Scientific Instruments, vol. 20, No. 9, Sep. 1949, pp. 660-663.
Svendlindh, et al., "Static Scaling in an Amorphous Metallic Spin Glass," Europhysics Letters, 2 (10), pp. 805-812 (1986).
Butera, et al., "Apparatus for the Determination of Magnetothermodynamic Properties to High Fields at Low Temperatures utilizing a Superconducting Magnet," The Review of Scientific Instruments, vol. 39, No. 8, Aug. 1968, pp. 1138-1144.
Nave et al., "Micromagnetic susceptometer," The Review of Scientific Instruments, 51(5), pp. 591-596 (May 1980).
Hein et al., "Differential Paramagnetic Effect in Superconductors," Physical Review, vol. 121, No. 2, pp. 407-415 (Jul. 15, 1961).
Campbell et al., "Critical field measurements in sueprconductors using ac inductive techniques," Review ofScientific Instruments, 54 (9), pp. 1191-1198 (Sep. 1983).

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Magnetic property characterization system employing a single sen does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Magnetic property characterization system employing a single sen, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Magnetic property characterization system employing a single sen will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-141310

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.