Semiconductor device manufacturing: process – Having magnetic or ferroelectric component
Reexamination Certificate
2005-06-14
2005-06-14
Wilson, Christian (Department: 2824)
Semiconductor device manufacturing: process
Having magnetic or ferroelectric component
C257S295000
Reexamination Certificate
active
06905888
ABSTRACT:
A ferromagnetic data layer of a magnetic memory element is formed with a controlled nucleation site. In some embodiments, the nucleation site may be a divot in the data layer or a protrusion from the data layer. A Magnetic Random Access Memory (“MRAM”) device may include an array of magnetic memory elements having data layers with controlled nucleation sites.
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Bhattacharyya Manoj
Nickel Janice H.
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