Active solid-state devices (e.g. – transistors – solid-state diode – Responsive to non-electrical signal – Magnetic field
Reexamination Certificate
2011-04-26
2011-04-26
Tran, Tan N (Department: 2826)
Active solid-state devices (e.g., transistors, solid-state diode
Responsive to non-electrical signal
Magnetic field
C257S422000, C257S424000, C257S427000, C257SE29167
Reexamination Certificate
active
07932573
ABSTRACT:
A magnetic memory element having a layer structure containing a fixing layer (pinned layer: PL) having a magnetization direction fixed unidirectionally, a nonmagnetic dielectric layer (TN1) in contact with the fixing layer (PL), and a memory layer (free layer: FL) having a first surface in contact with the nonmagnetic dielectric layer (TN1) and a second surface on the opposite to the first surface, the magnetization direction of the memory layer (FL) having a reversible magnetization direction in response to the current through the layer structure. The entire surface of the first surface of the memory layer (FL) is covered with the nonmagnetic dielectric layer (TN1) and in the joint surface of the nonmagnetic dielectric layer (TN1) and the fixing layer (PL), the first surface of the nonmagnetic dielectric layer (TN1) is exposed in a manner of surrounding the joint surface.
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Huai, Y., et al. “Observation of spin-transfer switching in deep submicron-sized and low resistance magnetic tunnel junctions”, Applied Physics Letters, Apr. 19 2004, pp. 3118-3120, vol. 84 No. 16, American Institute of Physics.
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Furukawa Taisuke
Kuroiwa Takeharu
Takada Hiroshi
Takenaga Takashi
McDermott Will & Emery LLP
Renesas Electronics Corporation
Tran Tan N
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