Semiconductor device manufacturing: process – Having magnetic or ferroelectric component
Reexamination Certificate
2007-11-06
2007-11-06
Nhu, David (Department: 2818)
Semiconductor device manufacturing: process
Having magnetic or ferroelectric component
C438S238000, C438S381000, C438S712000, C257SE21008, C257S091000, C257S218000, C257S665000
Reexamination Certificate
active
11171323
ABSTRACT:
A method of manufacturing a magnetic memory device includes forming an insulation layer on a substrate, forming a lower electrode on the insulation layer, forming a magneto-resistive film on an upper surface of the lower electrode, the magneto-resistive film including an insulation barrier layer and a plurality of magnetic films stacked on both sides of the insulation barrier layer, stacking a mask layer on the magneto-resistive film, performing ion etching on the magneto-resistive film, using the mask layer as a mask, thereby forming a magneto-resistive element, forming an insulation film on upper surfaces of the mask, the magneto-resistive element and the lower electrode, and etching the insulation film with an ion beam such that a side surface of the magneto-resistive element is exposed.
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Amano Minoru
Nakajima Kentaro
Takahashi Shigeki
Ueda Tomomasa
Kabushiki Kaisha Toshiba
Nhu David
Oblon & Spivak, McClelland, Maier & Neustadt P.C.
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