Magnetic imaging microscope test system and its application...

Details Magnetic imaging microscope test system and its application... Magnetic imaging microscope test system and its application...

2006-04-04

2006-04-04

Ledynh, Bot (Department: 2862)

Electricity: measuring and testing

Magnetic

Magnetic information storage element testing

C324S252000

Reexamination Certificate

active

07023204

ABSTRACT:
A novel magnetic imaging microscope test system with high spatial (1–10 nm) and temporal (˜1 ns) resolution of the magnetic field is disclosed, as well as the system application for characterization of read and write heads for magnetic recording. The test system includes a scanner assembly and a work piece holder for holding a work piece to be tested. The scanner assembly and the work piece holder are positionable relative to each other at very fine resolution during scanning. A probe arm is cantilevered from the scanner assembly to bring a probe head into close proximity to the work piece holder. The probe head is configured scan a work piece in contacting engagement therewith so that a magnetic device on the probe head magnetically interacts with a magnetic field generating or magnetic field sensing device on the work piece. A probe head for use in the test system and a related test method are also disclosed.

REFERENCES:
patent: 5171992 (1992-12-01), Clabes et al.
patent: 5266897 (1993-11-01), Watanuki et al.
patent: 5331589 (1994-07-01), Gambino et al.
patent: 5465046 (1995-11-01), Campbell et al.
patent: 5900728 (1999-05-01), Moser et al.
patent: 5900729 (1999-05-01), Moser et al.
patent: 5939715 (1999-08-01), Kitamura et al.
patent: 6064201 (2000-05-01), Cha et al.
patent: 6211673 (2001-04-01), Gerber et al.
patent: 6657431 (2003-12-01), Xiao
patent: 10-019907 (1998-01-01), None
patent: 10-019909 (1998-01-01), None

Affiliated with

Also associated with

Rating

Magnetic imaging microscope test system and its application... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Magnetic imaging microscope test system and its application..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Magnetic imaging microscope test system and its application... will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3538481