Electricity: measuring and testing – Magnetic – Magnetometers
Patent
1993-02-24
1993-11-30
Snow, Walter E.
Electricity: measuring and testing
Magnetic
Magnetometers
324260, G01R 3302
Patent
active
052668975
ABSTRACT:
Tunneling microscopy can be used to observe simultaneously the topography of a sample surface that is conductive and data related to the magnetic field near the surface. A tunneling microscope apparatus has a cantilever supporting a tip which has a magnetic moment. To use the apparatus according to a first preferred method, a magnetic field alternating at a predetermined frequency is produced by the sample near the sample surface to vibrate the tip by a magnetic interaction with the magnetic moment. To use the apparatus according to a second preferred method, the direction of the magnetic moment of the tip is switched at a predetermined frequency to vibrate the tip by creating an interaction between the magnetic moment and a magnetic field of the sample. For both preferred methods, the tip is maintained at a distance from the sample surface so as to permit a tunneling current to flow. A component of the predetermined frequency of the tunneling current is extracted to obtain a signal for observing the magnetic field.
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Sai Fuminori
Sueoka Kuniaki
Watanuki Osaaki
Ellett, Jr. J. David
International Business Machines - Corporation
Snow Walter E.
Trepp Robert M.
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