Magnetic field measurement optimization apparatus using a charge

Details Magnetic field measurement optimization apparatus using a charge Magnetic field measurement optimization apparatus using a charge

1990-10-31

1992-05-05

Wieder, Kenneth A.

Electricity: measuring and testing

Magnetic

Magnetometers

G01R 3302

Patent

active

051111411

ABSTRACT:
A magnetic field measuring apparatus measures the magnetic field intensity of a magnetic field created by a sample magnetic head by passing a finely focussed charged particle beam through the magnetic field and by measuring the deflection of the charged particle beam caused by the deflecting action of the magnetic field on the charged particle beam. The path of the charged particle beam (the sample magnetic head) is shifted stepwise toward the sample magnetic head (the path of the charged particle beam) until the charged particle impinges on the surface of the sample magnetic head. Upon the detection of the impingement of the charged particle beam on the surface of the sample magnetic head, the path of the charged particle beam (the sample magnetic head) is put one step back so that the path of the charged particle beam extends as close as possible to the surface of the sample magnetic head for accurate magnetic field intensity measurements. Thus, the distribution of magnetic field intensity in the magnetic field can be accurately determined.

REFERENCES:
patent: 3727127 (1973-04-01), Heidenwolf
patent: 4803430 (1989-02-01), Shinada et al.
"49th Oyo Butsuri Gakkai Gakujutsu Keen Yoko-shu", p. 559, Oct. 1988.
"IEEE Transactions on Magnetics", vol. MAG-21, No. 5, pp. 1593-1595, Sep. 1985.

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