Electricity: measuring and testing – Magnetic – Magnetometers
Reexamination Certificate
2004-09-22
2008-05-20
LeDynh, Bot (Department: 2862)
Electricity: measuring and testing
Magnetic
Magnetometers
C324S249000, C324S207210, C324S244000, C324S207250, C324S207110, C324S260000
Reexamination Certificate
active
07375516
ABSTRACT:
A magnetic field detector having a reference magnetoresistive element and a magnetic field detecting magnetoresistive element. The reference magnetoresistive element and the magnetic field detecting magnetoresistive element each has a stack structure including an antiferromagnetic layer, a fixed layer of a ferromagnetic material with the direction of magnetization fixed by the antiferromagnetic layer, a nonmagnetic layer, and a free layer of a ferromagnetic material with the direction of magnetization adapted to be changed by an external magnetic field. The reference magnetoresistive element is such that the direction of magnetization of the fixed layer and the direction of magnetization of the free layer in the nonmagnetic field are parallel or antiparallel to each other, and the magnetic field detecting magnetoresistive element is such that the direction of magnetization of the fixed layer and the direction of magnetization of the free layer in the nonmagnetic field are different from each other. Thus, it is possible to provide a magnetic field detector capable of singly calibrating the sensitivity and the resolution of the detector whenever required.
REFERENCES:
patent: 7023206 (2006-04-01), Viehland et al.
patent: 8 226960 (1996-09-01), None
patent: 2000 180207 (2000-06-01), None
patent: 2001 217484 (2001-08-01), None
U.S. Appl. No. 11/509,609, filed Aug. 25, 2006, Furukawa et al.
Beysen Sadeh
Furukawa Taisuke
Kobayashi Hiroshi
Kuroiwa Takeharu
Takenaga Takashi
LeDynh Bot
Mitsubishi Electric Corporation
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