Electricity: measuring and testing – Magnetic – Magnetic information storage element testing
Patent
1994-02-28
1995-08-22
Strecker, Gerard R.
Electricity: measuring and testing
Magnetic
Magnetic information storage element testing
360 7704, G11B 2014, G01R 3312
Patent
active
054443717
ABSTRACT:
An offset amount measuring apparatus for measuring an offset amount resulting from an offset produced when a disk, which is provided with a plurality of clock mark signals recorded around each circular data track at physically regular intervals, is mounted by chucking on a disk apparatus, reading the clock mark signals from the circular data track with a head, is disclosed. The apparatus comprises time interval measurement means for measuring the time interval between clock mark reproduced signals output from the head while the head is positioned at a distance of a predetermined radius from the center of rotation of the disk, offset amount calculation means for obtaining the distance between a locus of the head traced on the disk when the same is rotated and the circular data track from the time interval between the clock mark reproduced signals measured by the time interval measurement means, and offset amount storage means for storing the distance obtained by the offset amount calculation means as the offset amount in relation to the angle of rotation of the disk. By the use of this apparatus, it is possible to measure the offset amount electronically without using a mechanical measuring instrument, and precisely without decreasing the disk capacity.
REFERENCES:
Patent Abstracts of Japan, vol. 15, No. 162, Apr. 23, 1991 (Yosuke et al.).
Patent Abstracts of Japan, vol. 13, No. 520, Nov. 21, 1989 (Shigenobu et al.).
Patent Abstracts of Japan, vol. 15, No. 402, Oct. 14, 1991 (Masao).
Patent Abstracts of Japan, vol. 16, No. 571, Dec. 11, 1992 (Nobuyuki).
Takeda Toru
Tomisaki Itaru
Maioli Jay H.
Sony Corporation
Strecker Gerard R.
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