Magnetic detection of short circuit defects in plate structure

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – For fault location

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324537, G01R 3128

Patent

active

061182796

ABSTRACT:
A probability analysis technique is performed on magnetically obtained current data to detect short circuit defects in a plate structure (10) in which a group of first electrical conductors (32) are nominally electrically insulated from and cross a group of second electrical conductors (48). In particular, a magnetic current-sensing operation is performed on at least part of the conductors to produce current data indicative of how much, if any, current flows through each of at least part of the conductors. A short circuit defect probability analysis is then applied to the current data in order to select a location where one of the first conductors crosses one of the second conductors as being most probable of having a short circuit defect.

REFERENCES:
patent: 3753089 (1973-08-01), Gunn et al.
patent: 3882287 (1975-05-01), Simmonds
patent: 3992663 (1976-11-01), Seddick
patent: 4186338 (1980-01-01), Fichtenbaum
patent: 4829238 (1989-05-01), Goulette et al.
patent: 5006788 (1991-04-01), Goulette et al.
patent: 5073754 (1991-12-01), Henley
patent: 5218294 (1993-06-01), Soiferman
patent: 5309108 (1994-05-01), Maeda et al.
patent: 5406209 (1995-04-01), Johnson et al.
patent: 5424633 (1995-06-01), Soiferman
patent: 5462467 (1995-10-01), Macaulay et al.
patent: 5475695 (1995-12-01), Caywood
patent: 5486753 (1996-01-01), Khazam et al.
patent: 5517110 (1996-05-01), Soiferman
patent: 5559389 (1996-09-01), Spindt et al.
patent: 5564959 (1996-10-01), Spindt et al.
patent: 5578930 (1996-11-01), Sheen
patent: 5714888 (1998-02-01), Naujoks
patent: 5821759 (1998-10-01), Scaman et al.
Resnick et al, Physics for Students of Science and Engineering (John Wiley & Sons, 2d ed.), 1963, pp. 780 & 781 (Month Unavailable).
Ferguson et al, "A CMOS Fault Extractor for Inductive Fault Analysis," IEEE Transactions on Computer-Aided Design, vol. 7, No. 11, Nov. 1988, pp. 1181-1988.
Maly et al, "Systematic Characterization of Physical Defects for Fault Analysis of MOS IC Cells," Procs. Int'l. Test Conf., 15-18 Oct. 1984, pp. 390-399.

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