Data processing: measuring – calibrating – or testing – Testing system – Of mechanical system
Reexamination Certificate
2008-06-20
2009-06-16
Nghiem, Michael P. (Department: 2863)
Data processing: measuring, calibrating, or testing
Testing system
Of mechanical system
Reexamination Certificate
active
07548827
ABSTRACT:
A magnetic data processing apparatus having a first generation part that stores samples of the magnetic data in accordance with a first sampling rule, and generates first offset update data based on the stored samples of the magnetic data when a distribution of the stored samples of the magnetic data indicates a first feature. A second generation part stores samples of the magnetic data in accordance with a second sampling rule, and generates second offset update data based on the stored samples of the magnetic data when a distribution of the stored samples of the magnetic data indicates a second feature. An update part updates an offset value of the magnetic data based on the first offset update data when the same is generated, and updates the offset value of the magnetic data based on the second offset update data when the same is generated.
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patent: 2006/0031014 (2006-02-01), Sato et al.
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Dickstein & Shapiro LLP
Khuu Cindy H
Nghiem Michael P.
Yamaha Corporation
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