Machine for testing and sorting capacitor chips and method of op

Classifying – separating – and assorting solids – Sorting special items – and certain methods and apparatus for... – Condition responsive means controls separating means

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Details

209919, 324537, 324757, B07C 5344, G01R 3102

Patent

active

056737998

ABSTRACT:
A method of continuously testing and sorting large quantities of capacitor chips, including the steps of loading the chips into identical rows of aligned positions in a rotatable member, simultaneously and sequentially rotating the member to advance the chips past a plurality of testing stations and past subsequent sorting stations, each station successively aligned momentarily with each row of the aligned chips, simultaneously and sequentially conducting a plurality of sequential electrical testing to the chips as they are rotated from test station to test station and classifying them in a plurality of ranges of values at the last test station, and at each subsequent sorting station, sequentially collecting chips belonging in one of the ranges of values until all the chips are collected before the rotating member returns for reloading.

REFERENCES:
patent: 3750878 (1973-08-01), Atchley et al.
patent: 3980553 (1976-09-01), Quinn
patent: 4406373 (1983-09-01), Braden
patent: 4790438 (1988-12-01), Wilhelm et al.

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