Machine cluster topology representation for automated testing

Electrical computers and digital processing systems: multicomput – Computer network managing – Computer network monitoring

Reexamination Certificate

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Details

C714SE11159, C714S025000, C709S220000

Reexamination Certificate

active

07827273

ABSTRACT:
Software (such as server products) operating in a complex networked environment often run on multi-machine installations that are known as machine clusters. A server product can be tested on a server machine type. The server product can be tested by tracking the constituent machines of a machine cluster, and configuring and recording the roles that each machine in the machine cluster plays. Scenarios targeting a single server machine-type can be seamlessly mapped from the single machine scenario to a machine cluster of any number of machines, while handling actions such as executing tests and gathering log files from all machines of a machine cluster as a unit.

REFERENCES:
patent: 5371883 (1994-12-01), Gross et al.
patent: 6662217 (2003-12-01), Godfrey et al.
patent: 6681389 (2004-01-01), Engel et al.
patent: 6804709 (2004-10-01), Manjure et al.
patent: 7055137 (2006-05-01), Mathews
patent: 7058858 (2006-06-01), Wong et al.
patent: 7203864 (2007-04-01), Goin et al.
patent: 2002/0184555 (2002-12-01), Wong et al.
patent: 2003/0103310 (2003-06-01), Shirriff
patent: 2004/0107414 (2004-06-01), Bronicki et al.
patent: 2005/0251716 (2005-11-01), Degrenand
patent: 2006/0080658 (2006-04-01), Marion et al.
Experience in Testing the Motif Interface http://ieeexplore.ieee.org/iel1/52/2484/00073746.pdf?isnumber=&arnumber=73746, pp. 26-33.
Oasys: a framework for analog circuit synthesis http://ieeexplore.ieee.org/iel2/874/3489/00123242.pdf?isnumber=&arnumber=123242, 4 pages.
DiPerF: an automated Distributed PERformance testing Framework http://people.cs.uchicago.edu/matei/papers/grid2004.pdf, 8 pages.

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