Image analysis – Applications – Manufacturing or product inspection
Patent
1996-09-16
1997-12-30
Boudreau, Leo
Image analysis
Applications
Manufacturing or product inspection
382108, 382110, 348 91, 348 92, 25055918, 25055945, G06K 900
Patent
active
057039607
ABSTRACT:
Grain defect scanning takes into account a broad set of data representing both wood grain structure and wood grain image to provide a multi-dimensional scan vector for an inspection point with wide variation therein relative to defect types. A library of similarly structured multi-dimensional training set vectors developed during a preliminary training session with known defect types is referenced by multivariate pattern recognition analysis to classify a collection of scan vectors associated with an article under inspection. By statistically matching scan vectors with training set vectors under pattern recognition analysis, physical locations on a wood article are identified according to known defect types.
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Boudreau Leo
Harrington Robert L.
Shawala Bipin
U.S. Natural Resources, Inc.
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