LSI with built-in test circuit and testing method therefor

Details LSI with built-in test circuit and testing method therefor LSI with built-in test circuit and testing method therefor

1992-04-28

1995-01-10

Nguyen, Vinh

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

324 731, G01R 3100

Patent

active

053810872

ABSTRACT:
A high-speed LSI chip to be tested and evaluated by a readily available low-speed semiconductor tester and evaluation equipment. The high-speed LSI includes within the chip a clock supply circuit for supplying a high speed clock and an internal circuit, connected to the clock supply circuit, in which the high-speed clock is supplied from the clock supply circuit. A method for testing and evaluating the LSI chip. The method includes the steps of: supplying a high-speed clock generated from a clock supply circuit which is located within the semiconductor chip; and sending back a result of a semiconductor chip in response to the high-speed clock to the tester/evaluation equipment to be evaluated.

REFERENCES:
patent: 4752729 (1988-06-01), Jackson et al.
patent: 4894605 (1990-01-01), Ringleb et al.
patent: 4912709 (1990-03-01), Teske et al.
patent: 5097205 (1992-03-01), Toyoda
patent: 5132614 (1992-07-01), Sakamoto et al.
patent: 5144230 (1992-09-01), Katoozi et al.
patent: 5159263 (1992-10-01), Yaguchi
patent: 5189365 (1993-02-01), Ikeda et al.

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