Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2006-10-31
2006-10-31
Karlsen, Ernest (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S754090, C324S761010, C324S762010
Reexamination Certificate
active
07129728
ABSTRACT:
There is provided an LSI socket containing a pogo-pin type decoupling capacitor for reducing the potential fluctuation of power supplies and GNDs at the time of testing LSI incorporated in a BGA package. The LSI socket comprises a printed board102containing decoupling capacitors113corresponding to one or more power supply voltages inside thereof, a pogo-pin supporting casing portion104on which the printed board102is overlapped into a single piece, and pogo-pins103inserted into penetrating holes in which hole positions of through holes109drilled in the printed board102and casing holes114drilled in the pogo-pin supporting casing portion104are allowed to be matched, wherein the printed board102is disposed on the upper surface side of the pogo-pin supporting casing portion104which faces the BGA package, or disposed on the lower surface side of the pogo-pin supporting casing portion104, at the time of testing the LSI incorporated in the BGA package.
REFERENCES:
patent: 6512389 (2003-01-01), Kocher
patent: 6924637 (2005-08-01), Casey et al.
patent: 6961231 (2005-11-01), Alexander et al.
patent: 2002/0180469 (2002-12-01), Wu et al.
patent: 2003-043068 (2003-02-01), None
patent: 2003-050262 (2003-02-01), None
Foley & Lardner LLP
Karlsen Ernest
NEC Corporation
Vazquez Arleen M.
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