LSI test circuit

Details LSI test circuit LSI test circuit

1994-06-03

1995-08-15

Karlsen, Ernest F.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

3241581, 324537, 371 225, G01R 3128

Patent

active

054423015

ABSTRACT:
A LSI test circuit includes an exclusive-OR gate and an external output pin. The exclusive-OR gate receives at least part of the values supplied from external input pins of a LSI. The output of the exclusive-OR gate is connected to the external output pin.

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