LSI Circuit logic structure including data compression circuitry

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371 18, G06F 1126

Patent

active

043205097

ABSTRACT:
A logic structure for an LSI digital circuit includes data compression circuitry for deriving a signature word from the data on a multiplicity of internal nodes which are not directly accessible from the terminals of the circuit. The signature word provides error information concerning the data on the internal nodes which are not otherwise available for testing purposes. The addition of data compression circuitry facilitates the testing of LSI digital circuits and can be complemented with minimal overhead chip area.

REFERENCES:
patent: 3582633 (1971-06-01), Webb
patent: 3958110 (1976-05-01), Hong et al.
patent: 3976864 (1976-08-01), Gordon et al.
patent: 4074851 (1978-02-01), Eichelberger et al.
patent: 4167780 (1979-09-01), Hayashi
patent: 4176258 (1979-11-01), Jackson
Pynn, "In-Circuit Tester Using Signature Analysis Adds Digital LSI to its Range", Electronics, May, 24, 1979, pp. 153-157.

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