Low-voltage noise preventing circuit using abrupt...

Electricity: electrical systems and devices – Safety and protection of systems and devices – Transient responsive

Reexamination Certificate

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Reexamination Certificate

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07911756

ABSTRACT:
Provided are a low-voltage noise preventing circuit using an abrupt metal-insulator transition (MIT) device which can effectively remove a noise signal with a voltage less than a rated signal voltage. The abrupt MIT device is serially connected to the electrical and/or electronic system to be protected from the noise signal, and is subject to abrupt MIT at a predetermined voltage. Accordingly, low-voltage noise can be effectively removed.

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International Search Report and Written Opinion for PCT/KR2006/000778 dated Jun. 8, 2006.
Office Action dated Feb. 2, 2010 and issued in counterpart Japanese Application No. 2008-501802.
Hyun-Tak Kim et al., “Raman study of electric-field-induced first-order metal-insulator transition in VO2-based devices”, Applied Physics Letters 86.242101 pp. 103 (2005).
Doo-Hyeb Youn et al., “Observation of Abrupt Metallic Transitions in p-Type GaAs Devices and Comparison with Avalanche Breakdown in the InGaAs APD”, Journal of the Korean Physical Society, vol. 47, No. 1, Jul. 2005, pp. 1-5.
Hyun-Tak Kim et al., “Mechanism and Observation of MOTT Transition in VO2-based two- and three-terminal devices”, New Journal of Physics 6(52), May 17, 2004, pp. 1-19.

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