Low voltage erase of a flash EEPROM system having a common erase

Static information storage and retrieval – Floating gate – Particular connection

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

36518529, 257316, 257318, G11C 700, G11C 1602

Patent

active

055792596

ABSTRACT:
A flash EEPROM is organized on an integrated circuit with individual erase gates being shared by two adjacent blocks (sectors) of memory cells. This reduces the number of erase gates and the complexity of the driving erase circuitry. Each of the two adjacent blocks are individually addressable for erasing. The control gates of the cells within the block that is not to be erased are held at a voltage close to that of the common erase gate, thus preventing their storage states from being disturbed. At the same time, the control gates of the block to be erased are held at a voltage that differs sufficiently from that of the erase gate to cause the erasure. In order to minimize the magnitude of the erase voltages, voltages applied to the common erase gate and the control gates of the block to be erased are substantially equal and of opposite polarities.

REFERENCES:
patent: 5034926 (1991-07-01), Taura
patent: 5036378 (1991-07-01), Lu
patent: 5077691 (1991-12-01), Haddad et al.
patent: 5295106 (1994-03-01), Jinbo
patent: 5313420 (1994-05-01), Masuoka
patent: 5336936 (1994-08-01), Allen
patent: 5343063 (1994-08-01), Yuan et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Low voltage erase of a flash EEPROM system having a common erase does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Low voltage erase of a flash EEPROM system having a common erase, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Low voltage erase of a flash EEPROM system having a common erase will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-1978245

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.