Static information storage and retrieval – Floating gate – Particular connection
Reexamination Certificate
2006-11-08
2008-11-04
Nguyen, Dang T (Department: 2824)
Static information storage and retrieval
Floating gate
Particular connection
C365S230030, C365S230060
Reexamination Certificate
active
07447071
ABSTRACT:
A plurality of memory sub-arrays are formed in a p-well region. Each of the memory sub-arrays has at least one first-level column decoder that includes a plurality of low-voltage MOS selector transistors that are also formed within the p-well. A last-level decoder is formed outside of the p-well region and includes high-voltage MOS transistors to provide an output signal to one of an array of sense amplifiers. During a memory erase mode of operation, a high voltage is provided to bias the p-well region and a plurality of high-voltage switches are activated to provide a high voltage to gate terminals of the selector transistor in the first-level column decoders. One or more intermediate-level column decoders are formed as low-voltage selector transistors in the p-well between the first-level column decoder and the last-level column decoder. Each of the intermediate-level column decoders also has a high-voltage switch that is activated during a memory erase mode of operation to provide a high voltage to gate terminals of the intermediate-level column decoders.
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Frulio Massimiliano
Manfre Davide
Sacco Andrea
Surico Stefano
Atmel Corporation
Nguyen Dang T
Schwegman Lundberg & Woessner, P.A.
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