Active solid-state devices (e.g. – transistors – solid-state diode – Thin active physical layer which is – Low workfunction layer for electron emission
Reexamination Certificate
2005-10-04
2005-10-04
Schillinger, Laura M (Department: 2813)
Active solid-state devices (e.g., transistors, solid-state diode
Thin active physical layer which is
Low workfunction layer for electron emission
C257S295000, C257S314000
Reexamination Certificate
active
06952017
ABSTRACT:
One embodiment of the invention relates to a polymer memory device and a method of making it. The polymer memory device may include a composite or single layer of a ferroelectric polymer memory that addresses surface engineering needs according to various embodiments. The ferroelectric polymer memory structure may include crystalline ferroelectric polymer layers such as single and co-polymer compositions. The structure may include spin-on and/or Langmuir-Blodgett deposited compositions.One embodiment of the invention relates to a method making embodiments of the polymer memory device. One embodiment of the invention relates to a memory system that allows the polymer memory device to interface with various existing hosts.
REFERENCES:
patent: 4995705 (1991-02-01), Yoshinaga et al.
patent: 5932965 (1999-08-01), Berggren et al.
patent: 6005707 (1999-12-01), Berggren et al.
patent: 6005791 (1999-12-01), Gudesen et al.
patent: 6052354 (2000-04-01), Gudesen et al.
patent: 6055180 (2000-04-01), Gudesen et al.
patent: 6064615 (2000-05-01), Gudesen
patent: 6084850 (2000-07-01), Gudesen et al.
patent: 6088319 (2000-07-01), Gudesen
patent: 6141309 (2000-10-01), Saitou et al.
patent: 6219160 (2001-04-01), Nordal et al.
patent: 6236587 (2001-05-01), Gudesen et al.
patent: 6326936 (2001-12-01), Inganas et al.
patent: 6380553 (2002-04-01), Gudesen et al.
patent: 6380597 (2002-04-01), Gudesen et al.
patent: 6403396 (2002-06-01), Gudesen et al.
patent: 6424553 (2002-07-01), Berggren et al.
patent: 6429457 (2002-08-01), Berggren et al.
patent: 6432739 (2002-08-01), Gudesen et al.
patent: 6466473 (2002-10-01), Nair et al.
patent: 6498744 (2002-12-01), Gudesen et al.
patent: 6498746 (2002-12-01), Chow
patent: 6518669 (2003-02-01), Saiki et al.
patent: 6522568 (2003-02-01), Nair
patent: 6524887 (2003-02-01), Li et al.
patent: 6529398 (2003-03-01), Nair et al.
patent: 6541863 (2003-04-01), Horstmann et al.
patent: 6541869 (2003-04-01), Gudesen et al.
patent: 6565422 (2003-05-01), Homma et al.
patent: 6566276 (2003-05-01), Maloney et al.
patent: 6570440 (2003-05-01), Chow et al.
patent: 6587250 (2003-07-01), Armgarth et al.
patent: 6606261 (2003-08-01), Gudesen et al.
patent: 6611448 (2003-08-01), Nair et al.
patent: 6624457 (2003-09-01), Li et al.
patent: 6635498 (2003-10-01), Summerfelt et al.
patent: 6642069 (2003-11-01), Armgarth et al.
patent: 6646903 (2003-11-01), Chow
patent: 6646904 (2003-11-01), Chow
patent: 6649504 (2003-11-01), Gudesen
patent: 6667655 (2003-12-01), Chow et al.
patent: 6670659 (2003-12-01), Gudesen et al.
patent: 6683803 (2004-01-01), Gudesen et al.
patent: 6724511 (2004-04-01), Gudesen et al.
patent: 6734478 (2004-05-01), Johansson et al.
patent: 6756620 (2004-06-01), Li et al.
patent: 6770491 (2004-08-01), Tuttle
patent: 6798003 (2004-09-01), Li et al.
patent: 6827869 (2004-12-01), Podlesnik et al.
patent: 6833316 (2004-12-01), Saiki et al.
patent: 6833325 (2004-12-01), Huang et al.
patent: 6842357 (2005-01-01), Brown
patent: 6858862 (2005-02-01), Li et al.
patent: 2001/0040828 (2001-11-01), Berggren et al.
patent: 2002/0024835 (2002-02-01), Thompson et al.
patent: 2002/0060923 (2002-05-01), Thompson et al.
patent: 2002/0126365 (2002-09-01), Armgarth et al.
patent: 2002/0134980 (2002-09-01), Armgarth et al.
patent: 2002/0158295 (2002-10-01), Armgarth et al.
patent: 2002/0160116 (2002-10-01), Nordal et al.
patent: 2002/0174289 (2002-11-01), Chow
patent: 2002/0191435 (2002-12-01), Nordal
patent: 2003/0017627 (2003-01-01), Li et al.
patent: 2003/0018148 (2003-01-01), Kaspar et al.
patent: 2003/0024731 (2003-02-01), Nordal et al.
patent: 2003/0063499 (2003-04-01), Gudesen et al.
patent: 2003/0085439 (2003-05-01), Gudesen et al.
patent: 2003/0099126 (2003-05-01), Gudesen
patent: 2003/0103386 (2003-06-01), Broms et al.
patent: 2003/0107067 (2003-06-01), Gudesen
patent: 2003/0107085 (2003-06-01), Gudesen et al.
patent: 2003/0120859 (2003-06-01), Chow
patent: 2003/0120964 (2003-06-01), Chow et al.
patent: 2003/0120965 (2003-06-01), Dahl
patent: 2003/0128601 (2003-07-01), Gudesen et al.
patent: 2003/0137865 (2003-07-01), Thompson et al.
patent: 2003/0151940 (2003-08-01), Gudesen et al.
patent: 2003/0154426 (2003-08-01), Chow et al.
patent: 2003/0179617 (2003-09-01), Gudesen et al.
patent: 2003/0188251 (2003-10-01), Brown et al.
patent: 2003/0218191 (2003-11-01), Nordal et al.
patent: 2003/0224535 (2003-12-01), Andideh et al.
patent: 2004/0004887 (2004-01-01), Gudesen et al.
patent: 2004/0032759 (2004-02-01), Chow et al.
patent: 2004/0042288 (2004-03-01), Chow
patent: 2004/0047212 (2004-03-01), Chow
patent: 2004/0071018 (2004-04-01), Nordal et al.
patent: 2004/0100828 (2004-05-01), Garney et al.
patent: 2004/0102054 (2004-05-01), Leeson et al.
patent: 2004/0150023 (2004-08-01), Li et al.
patent: 2004/0152231 (2004-08-01), Li et al.
patent: 2004/0214009 (2004-10-01), Andideh
patent: 2004/0217402 (2004-11-01), Andideh
Diana et al—U.S. Appl. No. 10/816,260 Ion Implanting Conductive Electrodes of Polymer Memories.
Andideh et al.—U.S. Appl. No. 10/712,205 Parallel Electrode Memory.
Diana et al—U.S. Appl. No. 10/746,173 Polymer/Metal Interface with Multilayered Diffusion Barrier.
Steger et al—U.S. Appl. No. 10/882,423 Chemical-Mechanical Post-Etch Removal of Photoresist in Polymer Memory Fabrication.
Coulson et al—U.S. Appl. No. 10/877,914 Temperature Adaptive Ferro-Electric Memory Access Parameters.
PCT International Search Report.
Isenberger Mark
Li Jian
Mu Xiao-Chun
Intel Corporation
Schillinger Laura M
Wisor Rita M.
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