Low temperature tunneling transistor

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357 232, 357 22, 357 4, 357 15, 357 28, H01L 2978

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046479546

ABSTRACT:
The transistor comprises two electrodes, source (12) and drain (13), with a semiconductor tunnel channel (11) arranged therebetween. A gate (14) for applying control signals is coupled to the channel. The semiconductor, at low temperatures, behaves like an insulator with a low barrier (some meV) through which charge carriers can tunnel under the influence of an applied drain voltage. The tunnel current can be controlled by a gate voltage V.sub.G which modifies the barrier height between source and drain thereby changing the tunnel probability.

REFERENCES:
patent: 3500137 (1970-03-01), Schroen et al.
patent: 3882533 (1975-05-01), Dohler
patent: 4157555 (1979-06-01), Gray
patent: 4194935 (1980-03-01), Dingle
patent: 4220959 (1980-09-01), Kroger
patent: 4334158 (1982-06-01), Faris
patent: 4494016 (1985-01-01), Ronsom
Patent Abstracts of Japan, vol. 7, No. 17 (E-154)(1162), Jan. 22, 1983; & JP-A-57 176 781 (Tokyo Shibaura Denki K.K.) 30-10-1982.
Radio Engineering and Electronic Physics, vol. 22, No. 11, Nov. 1977, pp. 107-113, Washington, USA; V. N. Alfeyev, "Amplification Properties of Superconductor-Semiconductor Contacts".
IBM Technical Disclosure Bulletin, vol. 19, No. 4, Sep. 1976, p. 1461-Fang et al. entitled "Superconducting Field-Effect Transistor".
G. H. Doehler in Phys. Status Solidi (b) 52, 79 (1972).
G. H. Doehler in Phys. Status Solidi (b) 52, 533 (1972).
G. H. Doehler, J. Vac. Sci. Technol. 16(3) May/Jun. 1979, p. 851.

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